Atomic Force Microscopy - Flex-ANA — AFM for force mapping

A new tool for fully automated nanomechanical data acquisition and analysis.

Key features and benefits:

Fully integrated, automated atomic force microscope
Proprietary algorithm that facilitates nanomechanical measurements on uneven or undulating surfaces
Real-time, automated data collection, interpretation and analysis
Works on hard or soft, sticky or stiff, uneven or smooth, transparent or opaque samples

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Founded in 1997, Nanosurf is a Swiss-based high-tech company providing scanning probe microscopes to customers around the globe. Our product range starts with very compact instruments, followed by state-of-the-art research systems, all the way up to fully customized and comprehensive solutions. Our customers in research, industry and teaching value the innovative approach, the modularity, and the ease of use of our products.
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