NanoWorld® Pyrex-Nitride AFM probes are designed for various imaging applications in contact or dynamic mode AFM. They fit to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes).

The tipless NanoWorld® Pyrex-Nitride ( PNP) AFM probes consist of triangular silicon nitride AFM cantilevers supported by an AFM support chip made of pyrex-glass.
Tipless cantilevers such as these are often used for applications where the AFM cantilever needs to be functionalized or attaching objects (like molecules, particles, cells, etc. etc. ) to the end of the cantilever for example for force measurements. This is especially interesting for researchers in the fields of life science, biology and biophysics.

Currently the following versions of tipless Pyrex-Nitride AFM probes are available:

PNP-TR-TL – Silicon Nitride AFM probes with two different triangular AFM cantilevers on one support chip, gold reflex coating on the detector side of the cantilever:

Typical force constant cantilever beam 1 ( CB1): 0.32 N/m
Typical resonance frequency cantilever beam 1 (CB1): 67 kHz

Typical force constant cantilever beam 2 (CB2): 0.08 N/m
Typical resonance frequency cantilever beam 2 (CB2): 17 kHz

PNP-TR-TL-Au – Silicon Nitride AFM probes with two different triangular AFM cantilevers on one support chip, gold reflex coating on the detector side of the cantilever, gold coating on the sample facing side of the cantilever:
Typical force constant cantilever beam 1 ( CB1): 0.32 N/m
Typical resonance frequency cantilever beam 1 (CB1): 67 kHz

Typical force constant cantilever beam 2 (CB2): 0.08 N/m
Typical resonance frequency cantilever beam 2 (CB2): 17 kHz

Please contact us to find out more or have a look at: https://www.nanoworld.com/pyrex-nitride-silicon-nitride-afm-tips