NANOSENSORS™ conductive and wear resistant Platinum Silicide AFM probes are especially designed for applications where AFM probes that unite almost metal-like conductivity with high wear resistance and a relatively small AFM tip radius are needed.

Three types of Platinum Silicide AFM probes with different AFM cantilever values are currently available:

PtSi-CONT – for contact mode / repulsive mode AFM imaging
- this AFM probe type can be used for force distance spectroscopy or Pulsed Force Mode ( PFM ), Conductive Atomic Force Microscopy ( C-AFM ), Tunnelling AFM ( TUNA ) and Scanning Capacitance Microscopy ( SCM )
Typical force constant: 0.2 N/m
Typical resonance frequency: 13 kHz

PtSi-FM – for force modulation mode imaging
– this AFM probe type can be used for Conductive Atomic Force Microscopy ( C-AFM ), Tunnelling AFM ( TUNA ) , Scanning Capacitance Microscopy ( SCM ), Electrostatic Force Microscopy (EFM) and Kelvin Probe Force Microscopy (KPFM)
Typical force constant: 2.8 N/m
Typical resonance frequency: 75 kHz

PtSi-NCH
– for non-contact mode / tapping mode /attractive mode / dynamic mode AFM – can be used for Conductive Atomic Force Microscopy ( C-AFM ), Tunnelling AFM (TUNA ) and Scanning Capacitance Microscopy ( SCM )
Typical force constant: 42 N/m
Typical resonance frequency: 330 kHz

Please contact us if you have further questions or have a look at http://www.nanosensors.com/pdf/platinum_silicide.pdf

Application examples can be found in the NANOSENSORS blog: https://www.nanosensors.com/blog/tag/platinum-silicide-afm-probes/