The great advantage of this type of tuning-fork-based AFM probe is that users can benefit from both the tuning fork’s extremely stable oscillation and the silicon cantilever’s reasonable spring constant with one AFM probe.

Akiyama-Probe is equipped with a special version of the NANOSENSORS™ AdvancedTEC where the tip protrudes over the end of the cantilever.

It has a high-end sharp silicon AFM tip and has shown an excellent imaging capability on various samples with different properties. The resulting image quality is as high as that achieved with a conventional optical lever system.

There are many possible applications for the Akiyama probe.

The Akiyama probe is for example popular with users building their own Atomic Force Microscopes.

Another possibility of use of the Akiyama probes is in Atomic Force Microscopes which have been integrated into a Scanning Electron Microscope ( SEM ).

Other application examples can be found on the Akiyama probe webpage and the NANOSENSORS blog.

Please note that the Akiyama-probes cannot be used in every commercial AFM system.
It needs to be used in either an AFM specifically designed to work with the Akiyama-probe as it is offered by some manufacturers or it needs its own specific set-up.

Please contact us if you require further information or have a look at our dedicated webpage for this special AFM probe which offers more detailed information: https://www.akiyamaprobe.com/