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  • Park SmartScan™

Park SmartScan™

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  • Park Systems,Park Systems Corp.
  • Park SmartScan™
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Contact Details

  • Park Systems Corp.
  • Park Systems
  • 3040 Olcott St.
  • Santa Clara
  • CA
  • United States
  • +1-408-986-1110
  • http://www.parkafm.com/
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  • Park Systems,Park Systems Corp.
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  • Bringing the power and versatility of AFM technology to everyone

    Park SmartScan is a revolutionary operating software for Park AFMs that lets even inexperienced, untrained users produce high quality nanoscale imaging through three simple clicks of a mouse in auto mode, which rivals that made by experts using conventional techniques. SmartScan manual mode also provides all of the functions and tools necessary for more seasoned users to feel at home. This combination of extreme versatility, ease-of-use, and quality makes SmartScan the best AFM operating software available.

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  • Park Systems – Enabling Nanoscale Advances

    Park Systems serves its customers with a complete range of AFM solutions including AFM systems, options, and software, along with global service and support.

    Park Systems provides original and innovative AFM solutions for the most accurate nanoscale measurement. In nanoscale metrology, having data that is repeatable, reproducible, and reliable is just as crucial as resolution. The innovative crosstalk-elimination (XE) metrology platform ushered in a new era of nanometrology that overcomes non-linearity and non-orthogonality associated with conventional piezotube based systems. Park Systems' innovative AFM technology is a disruptive market force and it expands the application of nanometrology beyond the limits of conventional AFM technology.

    Park Systems promotes sustainable, long-term growth of its AFM business by constantly seeking to address the changing needs of AFM users. Our comprehensive portfolio of products, software, services, and expertise is designed and engineered to help customers achieve the nanometrology performance that meets the needs and requirements of present and future applications. Since improvements in nanometrology today are key to enabling tomorrow's research, analysis, processing and product manufacturing, our innovative technology and market leadership in the field of nanometrology secure our future at the forefront of the AFM industry.


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