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  • Park PTR Series

Park PTR Series

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  • Park Systems,Park Systems Corp.
  • Park PTR Series
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Contact Details

  • Park Systems Corp.
  • Park Systems
  • 3040 Olcott St.
  • Santa Clara
  • CA
  • United States
  • +1-408-986-1110
  • http://www.parkafm.com/
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  • Park Systems,Park Systems Corp.
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  • Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.

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  • Park Systems – Enabling Nanoscale Advances

    Park Systems serves its customers with a complete range of AFM solutions including AFM systems, options, and software, along with global service and support.

    Park Systems provides original and innovative AFM solutions for the most accurate nanoscale measurement. In nanoscale metrology, having data that is repeatable, reproducible, and reliable is just as crucial as resolution. The innovative crosstalk-elimination (XE) metrology platform ushered in a new era of nanometrology that overcomes non-linearity and non-orthogonality associated with conventional piezotube based systems. Park Systems' innovative AFM technology is a disruptive market force and it expands the application of nanometrology beyond the limits of conventional AFM technology.

    Park Systems promotes sustainable, long-term growth of its AFM business by constantly seeking to address the changing needs of AFM users. Our comprehensive portfolio of products, software, services, and expertise is designed and engineered to help customers achieve the nanometrology performance that meets the needs and requirements of present and future applications. Since improvements in nanometrology today are key to enabling tomorrow's research, analysis, processing and product manufacturing, our innovative technology and market leadership in the field of nanometrology secure our future at the forefront of the AFM industry.


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