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  • S2 Picofox

S2 Picofox

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Request the latest price from Bruker Nano GmbH

  • Stefan Meier,Bruker Nano GmbH
  • S2 Picofox
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Contact Details

  • Bruker Nano GmbH
  • Stefan Meier
  • Am Studio 2D
  • Berlin
  • N/A
  • Germany
  • +49 30 670990-8591
  • https://www.bruker.com/
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Contact Supplier

  • Stefan Meier,Bruker Nano GmbH
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  • The World's First TXRF Spectrometer for Trace Analysis

    The S2 PICOFOX is the world's first portable benchtop spectrometer for fast quantitative and semi-quantitative multi-element microanalysis of liquids, suspensions, solids and contaminations using the principle of total reflection X-ray fluorescence spectroscopy (TXRF).


    Reaching detection limits in the ppb and ppm range the S2 PICOFOX is optimally suited for trace element analysis. The advantages are evident in case of small sample amounts, liquid samples with high matrix content and frequently changing sample types.

    Due to its complete independence of any cooling medium, the analyzer can be used not only in the laboratory but also for on-site analyses in the field.


    For many applications the S2 PICOFOX will be an important enhancement to an existing AAS or ICP-OES system.

    Get more information

  • Bruker Nano Analytics, headquartered in Berlin, Germany is a worldwide leading manufacturer of systems for compositional and structural analysis at the micro- and nano-scale for electron microscopes and using X-ray fluorescence spectrometers.

    As a research-focused company, we invest in the development of innovative products to satisfy the needs of our markets and to give our clients the opportunity to perform their work using the most modern equipment available. Our instruments are used in research, education and a wide range of industries, including chemistry, pharmaceuticals, semiconductor, life science, nanotechnology. Our spectrometry product lines comprise:
    • QUANTAX spectrometers for microanalysis on scanning and transmission electron microscopes (EDS and WDS),
    • The XTrace micro-spot X-ray source for attachment to scanning electron microscopes,
    • The S2 PICOFOX spectrometer for total reflection X-ray fluorescence elemental analysis(TXRF),
    • The M4 TORNADO µ-XRF spectrometer for fast elemental distribution analysis.

    The products for structural analysis consist of:
    • QUANTAX EBSD, the fast and easy-to-use electron backscatter diffraction system (EBSD) for SEM
    • Micro-CT for SEM, the computed X-ray microtomography attachment for SEM.
    Visit company website

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