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  • QUANTAX Micro-XRF

QUANTAX Micro-XRF

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Request the latest price from Bruker Nano GmbH

  • Stefan Meier,Bruker Nano GmbH
  • QUANTAX Micro-XRF
  •  
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Contact Details

  • Bruker Nano GmbH
  • Stefan Meier
  • Am Studio 2D
  • Berlin
  • N/A
  • Germany
  • +49 30 670990-8591
  • https://www.bruker.com/
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Contact Supplier

  • Stefan Meier,Bruker Nano GmbH
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  • Upgrading SEMs for Trace Element Analysis
    XTrace Mounted on a SEM


    QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope. XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the trace element sensitivity and the higher information depth of XRF analysis.

    The user friendly Micro-XRF system for SEM

    • Distribution analysis with HyperMap stores complete spectra for every map point for on- and offline analysis
    • Samples can be analyzed with Micro-XRF and EDS without position change
    • Both methods are integrated in the same analytical software suite - ESPRIT 2.0
    • No interference with normal SEM operation, XTrace can stay in its measurement position most of the time.

    A complete micro-XRF spectrometer without the investment

    • Analytical results compare to those of standalone systems
    • Image tiling allows mapping large areas
    • Selectable primary radiation filters to suppress diffraction peaks
    • Uses the SEM motorized stage
    • Allows sample tilt to produce minimum spot sizes.

  • Bruker Nano Analytics, headquartered in Berlin, Germany is a worldwide leading manufacturer of systems for compositional and structural analysis at the micro- and nano-scale for electron microscopes and using X-ray fluorescence spectrometers.

    As a research-focused company, we invest in the development of innovative products to satisfy the needs of our markets and to give our clients the opportunity to perform their work using the most modern equipment available. Our instruments are used in research, education and a wide range of industries, including chemistry, pharmaceuticals, semiconductor, life science, nanotechnology. Our spectrometry product lines comprise:
    • QUANTAX spectrometers for microanalysis on scanning and transmission electron microscopes (EDS and WDS),
    • The XTrace micro-spot X-ray source for attachment to scanning electron microscopes,
    • The S2 PICOFOX spectrometer for total reflection X-ray fluorescence elemental analysis(TXRF),
    • The M4 TORNADO µ-XRF spectrometer for fast elemental distribution analysis.

    The products for structural analysis consist of:
    • QUANTAX EBSD, the fast and easy-to-use electron backscatter diffraction system (EBSD) for SEM
    • Micro-CT for SEM, the computed X-ray microtomography attachment for SEM.
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