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  • M4 Tornado

M4 Tornado

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Request the latest price from Bruker Nano GmbH

  • Stefan Meier,Bruker Nano GmbH
  • M4 Tornado
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Contact Details

  • Bruker Nano GmbH
  • Stefan Meier
  • Am Studio 2D
  • Berlin
  • N/A
  • Germany
  • +49 30 670990-8591
  • https://www.bruker.com/
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Contact Supplier

  • Stefan Meier,Bruker Nano GmbH
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  • 2D Micro-XRF with Ultimate Speed and Accuracy

    The Instrument of Choice for Highly Sensitive and Non-Destructive Element Analysis.

    The M4 TORNADO is the tool for sample characterization using small-spot Micro X-ray Fluorescence (Micro-XRF) analysis. Optimized for analysis speed and without compromising accuracy it measures a wide range of samples, whether small or large, even or irregularly shaped and generates a wealth of information on composition and element distribution.

    Equipped with a large high-speed stage it supports 2D analysis of virtually any kind of inorganic, organic and even of liquid sample. Providing spot sizes down to 25 µm (for Mo Kα radiation), excellent spatial resolution is warranted.

    The proven ESPRIT analysis software provides a flexible measurement setup and a variety of evaluation and processing tools. A large vacuum sample chamber supports light element detection.

    The instrument can be customized to provide extended measurement ranges or even higher analysis speed: flexibility can be enhanced through installation of a second tube with a different target and a collimator. An optional second SD detector increases speed even further.

    Get more information

  • Bruker Nano Analytics, headquartered in Berlin, Germany is a worldwide leading manufacturer of systems for compositional and structural analysis at the micro- and nano-scale for electron microscopes and using X-ray fluorescence spectrometers.

    As a research-focused company, we invest in the development of innovative products to satisfy the needs of our markets and to give our clients the opportunity to perform their work using the most modern equipment available. Our instruments are used in research, education and a wide range of industries, including chemistry, pharmaceuticals, semiconductor, life science, nanotechnology. Our spectrometry product lines comprise:
    • QUANTAX spectrometers for microanalysis on scanning and transmission electron microscopes (EDS and WDS),
    • The XTrace micro-spot X-ray source for attachment to scanning electron microscopes,
    • The S2 PICOFOX spectrometer for total reflection X-ray fluorescence elemental analysis(TXRF),
    • The M4 TORNADO µ-XRF spectrometer for fast elemental distribution analysis.

    The products for structural analysis consist of:
    • QUANTAX EBSD, the fast and easy-to-use electron backscatter diffraction system (EBSD) for SEM
    • Micro-CT for SEM, the computed X-ray microtomography attachment for SEM.
    Visit company website

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