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Bruker Nano Analytics, headquartered in Berlin, Germany is a worldwide leading manufacturer of systems for compositional and structural analysis at the micro- and nano-scale for electron microscopes and using X-ray fluorescence spectrometers.

As a research-focused company, we invest in the development of innovative products to satisfy the needs of our markets and to give our clients the opportunity to perform their work using the most modern equipment available. Our instruments are used in research, education and a wide range of industries, including chemistry, pharmaceuticals, semiconductor, life science, nanotechnology. Our spectrometry product lines comprise:
• QUANTAX spectrometers for microanalysis on scanning and transmission electron microscopes (EDS and WDS),
• The XTrace micro-spot X-ray source for attachment to scanning electron microscopes,
• The S2 PICOFOX spectrometer for total reflection X-ray fluorescence elemental analysis(TXRF),
• The M4 TORNADO µ-XRF spectrometer for fast elemental distribution analysis.

The products for structural analysis consist of:
• QUANTAX EBSD, the fast and easy-to-use electron backscatter diffraction system (EBSD) for SEM
• Micro-CT for SEM, the computed X-ray microtomography attachment for SEM.

Products listed on Nanowerk

M4 Tornado

2D Micro-XRF with Ultimate Speed and Accuracy The Instrument of Choice for Highly Sensitive and Non-Destructive Element Analysi...

Micro-CT for SEM

True 3D Microscopy for SEM Micro computed tomography (Micro-CT) for SEM adds true 3D microscopy to your SEM, regardless of manu...

OPTIMUS™ TKD Detector Head

Bruker’s high performance e-Flash EBSD detector series can be equipped with a special detector head designed for optimal geometr...

QUANTAX EBSD

The High-End, Easy-to-Use EBSD Analysis System Bruker's QUANTAX EBSD analysis system provides the analyst with an easy to use ...

QUANTAX EDS for SEM

Once again Bruker sets standards in performance and functionality in energy-dispersive spectrometry for the scanning electron micr...

QUANTAX EDS for TEM

Bringing the Speed and Versatility of SDDs to the Transmission Electron Microscope Once again Bruker sets standards in performa...

QUANTAX Micro-XRF

Upgrading SEMs for Trace Element Analysis XTrace Mounted on a SEM QUANTAX Micro-XRF with the XTrace micro-spot X-ray source ad...

QUANTAX WDS

Ultra-Sensitive Wavelength-Dispersive Spectrometry for SEM QUANTAX WDS features the compact XSense spectrometer. This high prec...

S2 Picofox

The World's First TXRF Spectrometer for Trace Analysis The S2 PICOFOX is the world's first portable benchtop spectrometer for...

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Downloads (Brochure/Application Notes/Articles)

5-on-1 range for SEM Brochure

With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all...

 
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5-on-1 range for SEM Brochure Details

  • With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM. Another step ahead is the new 4-in-1 software ESPRIT 2.0., which seamlessly integrates EDS, EBSD, WDS and Micro-XRF under a single user interface and allows researchers to combine data obtained by these complementary methods.

M4 Tornado Brochure

The M4 Tornado is a versatile instrument for fast and accurate high-resolution analysis of both small and large specimens. Samples require little or e...

 
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M4 Tornado Brochure Details

  • The M4 Tornado is a versatile instrument for fast and accurate high-resolution analysis of both small and large specimens. Samples require little or even no preparation at all for examination.

Micro-CT for SEM Brochure

X-ray micro-focus computer tomography (Micro-CT) is a non-destructive experimental technique where the 3D internal microstructure of the sample is vir...

 
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Micro-CT for SEM Brochure Details

  • X-ray micro-focus computer tomography (Micro-CT) is a non-destructive experimental technique where the 3D internal microstructure of the sample is virtually reconstructed with micrometer accuracy using X-ray shadow images of different orientations of the sample. Micro-CT for SEM adds a unique capability to acquire and visualize 2D/3D micromorphology throughout the entire sample volume with a SEM.

OPTIMUS™ TKD Detector Head Brochure

The OPTIMUS™ TKD detector head, as an addendum to QUANTAX EBSD, was specially designed to provide the best sample-detector geometry for Transmission...

 
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OPTIMUS™ TKD Detector Head Brochure Details

  • The OPTIMUS™ TKD detector head, as an addendum to QUANTAX EBSD, was specially designed to provide the best sample-detector geometry for Transmission Kikuchi Diffraction in the scanning electron microscope. It is user-interchangeable with the standard EBSD detector head of all Bruker e–Flash EBSD detectors. OPTIMUS™ integrates the ARGUS™ direct electron detection system for microstructural images at the highest possible resolution.

Quantax Brochure

The QUANTAX family of EDS systems offered by Bruker delivers reliable results across a broad range of applications with unprecedented speed, accuracy ...

 
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Quantax Brochure Details

  • The QUANTAX family of EDS systems offered by Bruker delivers reliable results across a broad range of applications with unprecedented speed, accuracy and ease of use.

QUANTAX EBSD Brochure

lectron backscatter diffraction relies on the effect that a number of the electrons hitting a crystallite in a sample in the scanning electron microsc...

 
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QUANTAX EBSD Brochure Details

  • lectron backscatter diffraction relies on the effect that a number of the electrons hitting a crystallite in a sample in the scanning electron microscope is scattered on the lattice plains of this crystallite. These electrons, carrying information on the crystal structure, are recorded with a special EBSD detector. In scanning the sample information on its microstructure can be compiled, like crystallinity, present phases, grain sizes, orientations, lattice strain, deformation and many more.

QUANTAX FlatQUAD Brochure

QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is ins...

 
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QUANTAX FlatQUAD Brochure Details

  • QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS. In combination with the ESPRIT analytical software suite QUANTAX FlatQUAD provides previously unheard of mapping performance, even for the most difficult samples.

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