Under the terms of the agreement, SEMATECH and QuantumClean will collaborate in the development of new methodologies involving process tool chamber parts cleaning and analytical methods for detecting particles beyond today's capabilities.
CRAIC Technologies introduces Spectral Surface Mapping software. This gives a user the ability to map the UV-visible-NIR absorbance, reflectance or fluorescence spectral response, point-by-point, with microscopic spatial resolution.
Oxford Instruments Asylum Research announces the new MFP-3D Infinity Atomic Force Microscope (AFM). The MFP-3D Infinity is the new flagship of the Asylum Research MFP-3D AFM family with dramatic performance improvements, new nanomechanical measurement capabilities, and new features that make it simple to get started with tapping mode imaging.
CurTran LLC announced that it has signed its first contract for LiteWire products with Weatherford International Ltd. Per the agreement, Weatherford will use, sell, and distribute LiteWire, the first commercial scale production of a carbon nanotube technology in wire and cable form.
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully automated AFM solution that improves throughput of AFM defect review by up to 1,000%. The 300mm bare wafer ADR AFM is a new process for identifying defects designed specifically for the semiconductor market without the need of reference markers.
CVD Equipment Corporation announces today that its CVD Materials Corporation subsidiary is accepting orders for 300 mm size CVD Graphene grown on Cu foil using its patent pending high quality, low cost CVD graphene process technology.